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Combined Raman-AFM instruments enable improved sample analysis by investigating chemical and structural properties of materials at sub-micrometer scales.
Extend your understanding of the nanoscaleThe Renishaw inVia Raman microscope is a highly flexible instrument that can be directly coupled to a wide range of AFMs and SPMs, including those made by Bruker Nano Surfaces, Nanonics Imaging Ltd, NT-MDT, JPK and Park. This enables you to choose an AFM suitable for the specific needs of your application area.
As well as providing co-localised Raman AFM measurements these combined systems can be used to collect Tip Enhanced Raman Spectroscopy (TERS) and to conduct near-field measurements (SNOM, NSOM). Combined Raman AFM measurements allow the investigating and characterisation of chemical and structural properties of materials at sub-micrometer scales.
Nanotechnology visualisation and analysis systems for research and industry
Renishaw offers fully integrated solutions with the Bruker Nano Surfaces Innova, the Bruker Nano Surfaces Bioscope Catalyst, the Nanonics MV series and the NT-MDT Ntegra.
What can a Renishaw Raman-AFM system do for you?
Raman with AFM
Tip Enhanced Raman Spectroscopy (TERS)
The spatial resolution of Raman spectroscopy is diffraction-limited to approximately half the wavelength of the incident laser light, because both the illuminating laser light and the Raman scattered light are collected in the optical far field. One way to achieve higher spatial resolution is to use a near field technique such as TERS. This technique involves using a plasmonic tip with a small apex to enhance the Raman signal at a very localised area of the sample. The Raman information from this small area can then be separated from the far field data potentially achieving resolutions better than 15 nm.
The Renishaw inVia Raman microscope has been used to collect TERS data in conjunction with a wide range of 3rd party instruments.
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